10 results
Defect Engineering and Atomic Relocation Processes in Impurity-Free Disordered GaAs and AlGaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 799 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Z2.6
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- 2003
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Defects Created by 25 keV Hydrogen Implantation in n-type GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, 14.3.1
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- 2001
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Electrical Characterization of Defects Introduced In n-GaN During High Energy Proton and He-Ion Irradiation
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 606-611
- Print publication:
- 1999
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Electrical Characterization of Sputter Deposition Induced Defects in n-GaN
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 612-617
- Print publication:
- 1999
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Electrical Characterization of Sputter Deposition Induced Defects in n-GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 537 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, G6.13
- Print publication:
- 1998
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Electrical Characterization of Defects Introduced in n-GaN During High Energy Proton and He-Ion Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 537 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, G6.12
- Print publication:
- 1998
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Electrical Characterization Of Defects Introduced During Plasma-Based Processing Of GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 442 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 51
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- 1996
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Electronic Properties Of Defects Formed In n-Si During Sputter-Etching In An Ar Plasma
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- Journal:
- MRS Online Proceedings Library Archive / Volume 442 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 87
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- 1996
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Introduction of Electrical Defects in P-Type Silicon due to Electron-Beam and RF Sputtering Metallization Processes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 25 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 619
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- 1983
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Characterization of Ion-Beam-Sputtered Molybdenum Films on N-Type Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 18 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 339
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- 1982
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